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yŠw—ðz ‘åã‘åŠwHŠw•”—nÚHŠw‰È‘²(1990.3)
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yŽóÜ—ðz ‘æ2‰ñƒeƒŒƒRƒ€EƒRƒƒ“ƒuƒXÜ(1993.3), MES'93—DG˜_•¶Ü (1993.6),•½¬5”N“x—nÚ˜_•¶§—ãÜ (1994.4)
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  1. “¡–{ŒöŽOCŠâ“c„Ž¡C’‡“cŽüŽŸCuƒÆ|ƒÏHough•ÏŠ·•½–Ê‚©‚ç‚Ì‚QŽŸ‹Èü‚̃pƒ‰ƒ[ƒ^’Šov, “dŽqî•ñ’ÊMŠw‰ï˜_•¶Ž, Vol.J74-D‡U, (1991), No.9, pp.1184-1191

  2. ’‡“cŽüŽŸCˆÉW‰@³lAŠâ“c„Ž¡Cuƒ}ƒCƒNƒÚ‡•”‚ÌŒ‡Š×ŒŸo‚̉”\« |ƒŒ[ƒUÆŽËŒ^”M‰æ‘œ–@‚É‚æ‚éƒ}ƒCƒNƒÚ‡•”Œ‡Š×ŒŸo‚ÉŠÖ‚·‚錤‹†i‘æ‚P•ñj|v, —nÚŠw‰ï˜_•¶W, Vol.11, (1993), No.4, p.509-515

  3. Šâ“c„Ž¡C’‡“cŽüŽŸCu”M“`“±ƒVƒ~ƒ…ƒŒ[ƒVƒ‡ƒ“‚É‚æ‚éÚ‡•”‚ÌŒ‡Š×ŒŸoðŒ‹y‚ÑŒŸoŒÀŠE¡–@‚ÌŒŸ“¢ |ƒŒ[ƒUÆŽËŒ^”M‰æ‘œ–@‚É‚æ‚éƒ}ƒCƒNƒÚ‡•”Œ‡Š×ŒŸo‚ÉŠÖ‚·‚錤‹†i‘æ‚Q•ñj|v, —nÚŠw‰ï˜_•¶W, Vol.11, (1993), No.4, p.p.515-519

  4. Šâ“c„Ž¡C’‡“cŽüŽŸCuƒKƒ‹ƒEƒBƒ“ƒOŒ^ƒŠ[ƒh‚̃\ƒ‹ƒ_ƒŠƒ“ƒOÚ‡•”‚̃q[ƒ‹•”‚ł̃tƒBƒŒƒbƒg‚ÌŒ`¬“x‡‚¢‚ÌŒŸoƒvƒƒZƒX‚ÌŒŸ“¢ |ƒŒ[ƒUÆŽËŒ^”M‰æ‘œ–@‚É‚æ‚éƒ}ƒCƒNƒÚ‡•”Œ‡Š×ŒŸo‚ÉŠÖ‚·‚錤‹†i‘æ‚R•ñj|v, —nÚŠw‰ï˜_•¶W, Vol.12, (1994), No.3 p.451-456

  5. Šâ“c„Ž¡C’†“ˆ@‘×C’‡“cŽüŽŸCuƒŒ[ƒUÆŽËŒ^”M‰æ‘œ–@‚ÌTABÚ‡•”‚Ö‚Ì“K—p‚ÌŒŸ“¢v, —nÚŠw‰ï˜_•¶W, Vol.16, (1998), No.3 p.332-339

  6. A“c[•FC‹à³Š¯CŠâ“c„Ž¡C“¡–{ŒöŽOC’‡“cŽüŽŸCuSn-Pb‹¤»ƒ\ƒ‹ƒ_‚Ì‚Ê‚êæ’[\‘¢‚̶¬ƒƒJƒjƒYƒ€‚ÌŒŸ“¢vC ‚‰·Šw‰ïŽ, Vol.26, (2000), No.2, pp.75-82

  7. ‹à³Š¯CA“c[•FCŠâ“c„Ž¡C“¡–{ŒöŽOC’‡“cŽüŽŸCuSn-Pb‹¤»ƒ\ƒ‹ƒ_‚Ì‚Ê‚êL‚ª‚è‰ß’ö‚Æ‚»‚Ì‹à‘®Šw“I\‘¢‚ÌŒŸ“¢vC ‚‰·Šw‰ïŽ, Vol.26, (2000), No.2, pp.83-90


‘“àd—v‰ï‹c˜_•¶i¸“Ç‚ ‚èj

  1. ’‡“cŽüŽŸCˆÉW‰@³lAŠâ“c„Ž¡CuƒŒ[ƒUÆŽËŒ^”M‰æ‘œ–@‚É‚æ‚éƒ}ƒCƒNƒÚ‡•”Œ‡Š×ŒŸo–@‚Æ‚»‚Ì“K—pv, ‘æ5‰ñƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ“ƒ|ƒWƒEƒ€(MES'93)˜_•¶W, 1993, p.119-122

  2. Šâ“c„Ž¡CŽR–{“N–çC’‡“cŽüŽŸCu’m“Iƒ}ƒCƒNƒŒ‡Š×ŒŸoƒVƒXƒeƒ€‚É‚¨‚¯‚é•¡”Ú‡ŠE–Ê‚Å‚ÌŒ‡Š×—L–³‚Ì”»’èƒAƒ‹ƒSƒŠƒYƒ€v, Proceedings of 1st@Symposium@Microjoining@and@Assembly@Technology@in@Electronics,@1995,@February,@Tokyo,@p.175-180

  3. ŽR–{“N–çCŠâ“c„Ž¡C’‡“cŽüŽŸCu’m“Iƒ}ƒCƒNƒŒ‡Š×ŒŸoƒVƒXƒeƒ€‚É‚¨‚¯‚錇Š×‚̈ʒuE¡–@‚Ì“¯’èƒAƒ‹ƒSƒŠƒYƒ€v, Proceedings of 1st@Symposium@Microjoining@and@Assembly@Technology@in@Electronics,@1995,@February,@Tokyo,@p.181-186

  4. ‹à³Š¯CA“c[•FCŠâ“c„Ž¡C“¡–{ŒöŽOC’‡“cŽüŽŸCuL‚ª‚莎Œ±‚É‚æ‚éSn-Pbƒ\ƒ‹ƒ_‚ÌL‚ª‚茻ۊώ@‚Æ‚Ê‚êæ’[\‘¢v, ‘æ9‰ñƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ“ƒ|ƒWƒEƒ€(MES'99)˜_•¶W, 1999, p.173-176

  5. ‹à³Š¯CA“c[•FCŠâ“c„Ž¡C“¡–{ŒöŽOC’‡“cŽüŽŸCuL‚ª‚莎Œ±‚É‚æ‚éƒ\ƒ‹ƒ_‚Ì‚Ê‚êL‚ª‚èæ’[•”‚̶¬ƒƒJƒjƒYƒ€‚ÉŠÖ‚·‚錟“¢v, ‘æ9‰ñƒ}ƒCƒNƒƒGƒŒƒNƒgƒƒjƒNƒXƒVƒ“ƒ|ƒWƒEƒ€(MES'99)˜_•¶W, 1999, p.181-184

  6. ¬—Ñ‘åŒáCŠâ“c„Ž¡C“¡–{ŒöŽOC’‡“cŽüŽŸCuƒŒ[ƒUÆŽËŒ^”M‰æ‘œ–@‚É‚æ‚éƒ}ƒCƒNƒŒ‡Š×‚Ì‚RŽŸŒ³ˆÊ’uî•ñ“¯’è‚ÌŒŸ“¢vC Proceedings of 6th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2000, pp.91-96

  7. ã“c’qOC‹ß“¡ŒÉ‹ßCŠâ“c„Ž¡C“¡–{ŒöŽOC’‡“cŽüŽŸCuƒ}ƒNƒ^ƒ~ƒNƒ“‡ˆÊ’uŒˆ‚߃VƒXƒeƒ€\’z‚Ì‚½‚ß‚ÌŠî‘b“IŒŸ“¢vC Proceedings of 7th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2001, pp.313-318

  8. ‰Y–쎋ICŽç‰®®‹GCŠâ“c„Ž¡C“¡–{ŒöŽOCuƒJƒeƒSƒŠ[ŠÔ‹——£‚ðl—¶‚µ‚½ƒjƒ…[ƒ‰ƒ‹ƒlƒbƒgƒ[ƒN‚É‚æ‚é•iŽ¿•]‰¿vC Proceedings of 8th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2002, pp.531-536

  9. Šâ“c„Ž¡CŽR–{C•½C“c’†~“ñC—Ñ^‘¾˜YC“¡–{ŒöŽOC²“¡—¹•½Cu”MÝŒvE‰ñ˜HÝŒv‹¦’²‚É‚æ‚éŠT—ªƒŒƒCƒAƒEƒgÝŒvŽè–@‚ÌŠî‘b“IŒŸ“¢vC Proceedings of 9th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2003, pp.409-414

  10. ŽR–{C•½, Šâ“c„Ž¡, —Ñ^‘¾˜Y, “¡–{ŒöŽO, ²“¡—¹•½, uƒ‚ƒWƒ…[ƒ‹Œ^Šî”ƒŒƒCƒAƒEƒgŠT—ª”MÝŒvŽx‰‡Žè–@‚Ì\’zvC Proceedings of 9th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2003, pp.415-420

  11. Šâ“c„Ž¡C—Ñ^‘¾˜YC–¾“cF“TC“¡–{ŒöŽOC²“¡—¹•½, uƒ‚ƒWƒ…[ƒ‹Œ^ŠT—ª‰ñ˜H‰ðÍEÝŒvŽx‰‡Žè–@‚Ì\’zvC Proceedings of 9th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2003, pp.421-426

  12. ‰¡“ckˆêC²“¡—¹•½CŠâ“c„Ž¡C“¡–{ŒöŽOC—  ¡ŒáC‹à‚ Œ’“ñ, u‚–§“x‰ñ˜HŽÀ‘•‚É‚¨‚¯‚éŒõ“`‘——pAuŒn”½ŽË”––Œ‚ÌŠJ”­vC Proceedings of 9th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2003, pp.466-472

  13. —Ñ^‘¾˜YCŠâ“c„Ž¡CŽR–{C•½C“¡–{ŒöŽOC²“¡—¹•½, u‚‘¬‚–§“x“dŽq‰ñ˜H‚Ì‚½‚߂̃‚ƒWƒ…[ƒ‹Œ^”MƒŒƒCƒAƒEƒgÝŒvŽè–@vC Proceedings of 10th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2004, pp.443-448

  14. ™’J@•FC²“¡—¹•½CŠâ“c„Ž¡CuÅ“K‰»Žè–@‚ð—p‚¢‚½ŽŸ¢‘ã‰t»ƒeƒŒƒr‚ÌŽ–‹Æ«•]‰¿‚ÉŠÖ‚·‚éŠî‘b“IŒŸ“¢|‹ZpŒo‰c‚É‚¨‚¯‚éVŽ–‹Æ«•]‰¿ƒVƒXƒeƒ€‚ÉŠÖ‚·‚錤‹†i‘æ‚P•ñj|vC Proceedings of 10th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2004, pp.437-442

  15. •“cWOC²“¡—¹•½CŠâ“c„Ž¡C‰¡“ckˆêC“¡–{ŒöŽOC— ¡ŒáC‹à‚Œ’“ñCu‚–§“xŒõE“dŽq•¡‡ƒ‚ƒWƒ…[ƒ‹—p‚”½ŽË—¦E‚Ú’…AgŒn”½ŽË–Œ‚ÌŠJ”­vC Proceedings of 10th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2004, pp.369-374

  16. Žç‰®®‹GC‘¾“c–M•vCŒä‰€¶’¼Ž÷CŠâ“c„Ž¡C“¡–{ŒöŽOCuƒjƒ…[ƒ‰ƒ‹ƒlƒbƒgƒ[ƒN‚É‚æ‚鎋ŠoŒŸ¸‚É‚¨‚¯‚é—v‘fŠÔ‹——£‚ÉŠî‚¢‚½‹³Žtƒf[ƒ^‘I’èvC Proceedings of 10th Symposium on Micro-joining and Assembly Technology in Electronics, Mate 2004, pp.449-454


‘Û‰ï‹c˜^

  1. Yoshiharu IWATA, Shuji NAKATA, "Detection on the Defects at the Soldered Joints in the QFP of Gull Wing type", 1st Eupropean conference on Electronic Packaging@Tecnology, 1994, February, Essen, Germany, p.39-42

  2. Yoshiharu IWATA, Shuji NAKATA, "Optimal Condition and Detectable Limit of the Defect Size for the Detection of the Micro Defect by Infrared Thermal Image Process", The 8th International Microelectronics Conference, 1994, April, Omiya, Japan, p.388-392

  3. Yoshiharu IWATA, Daigo KOBAYASHI, Kozo Fujimoto, Shuji NAKATA, "Detection of 3D Position Information of Internal Defects in Micro-Joining Parts by Infrared Thermal Imaging Method", Seventh International Welding Symposium, 2001, November, Kobe, Japan, p.1321-1326

  4. Yoshiharu IWATA, Shuhei YAMAMOTO, Shintaro HAYASHI, Kozo FUJIMOTO, "Conceptual Simulator for Thermal Design of High Speed and High Density Electronics System", Proceedings of 2002 International Conference on Electronics Packaging, 2002ICEP, pp.301-306

  5. Yoshiharu IWATA, Shuhei YAMAMOTO, Shintaro HAYASHI, Kozo FUJIMOTO, "Conceptual Simulator for Thermal Design of High Density Electronics System", The sixth VLSI Packaging Workshop of Japan Technical Digest, The sixth VLSI Packaging Workshop, pp.179-182

  6. Yoshiharu IWATA, Shintaro HAYASHI, Shuhei YAMAMOTO, Kozo FUJIMOTO, "Outline Design Assist Method for Electronics System Thermal Layout by Using Modularized Thermal Simulator", Proceedings of 2003 International Conference on Electronics Packaging, 2003ICEP, pp.238-243

  7. Koichi YOKOTA, Ryohei SATOH, Yoshiharu IWATA, Kozo FUJIMOTO, Shogo URA and Kenji KINTAKA, "Development of Au Reflection Film with High Adhesion for Optical Interconnection between LSI Chips", 2003 Proceedings 36th International Symposium on Microelectronics, pp.756-761
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hidenori@mapse.eng.osaka-u.ac.jp