A new estimation method for Ionic migration (IM), which is one of the critical failure modes for a printed circuit with narrow spacing between metal conductors, has been described. We propose the endurance test with In-situ observation by CCD camera in a chamber controlled temperature and humidity. By using the proposed method, we can investigate the appearance and development of IM considering the change of electronic resistance, and evaluate the velocity of IM growth. As the experimental results, it is revealed that the proposed method is very useful for the prediction of the life.

Keywords : Multi-scale Numerical Analysis, Finite Element Method, Mesh Superposition Method, Unsteady-state Transfer Analysis, Local Heterogeneity